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AuthorWitte, Pascaldc.contributor.author
AuthorKauffman, John G.dc.contributor.author
AuthorBrueckner, Timondc.contributor.author
AuthorBecker, Joachimdc.contributor.author
AuthorOrtmanns, Mauritsdc.contributor.author
Date of accession2018-09-10T09:49:42Zdc.date.accessioned
Available in OPARU since2018-09-10T09:49:42Zdc.date.available
Date of first publication2012dc.date.issued
Languageendc.language.iso
PublisherUniversität Ulmdc.publisher
Keywordconvertersdc.subject
Keywordnoisedc.subject
Dewey Decimal GroupDDC 620 / Engineering & allied operationsdc.subject.ddc
TitleAn Error Estimation Technique for Lowpass and Bandpass Sigma Delta ADC Feedback DACs Using a Residual Test Signaldc.title
Resource typeBeitrag zu einer Konferenzdc.type
FacultyFakultät für Ingenieurwissenschaften, Informatik und Psychologieuulm.affiliationGeneral
InstitutionInstitut für Mikroelektronikuulm.affiliationSpecific
DCMI TypeTextuulm.typeDCMI
CategoryPublikationsnachweiseuulm.category
Source - Title of source2012 IEEE International Symposium on Circuits and Systems (ISCAS 2012)source.title
Source - PublisherNew York, NYsource.publisherPlace
Source - Place of publicationIEEEsource.publisher
Source - Year2012source.year
Source - From page73source.fromPage
Source - To page76source.toPage
Source - SerialIEEE International Symposium on Circuits and Systemssource.series
Source - ISSN0271-4302source.identifier.issn
Source - ISBN978-1-4673-0219-7source.identifier.isbn
Conference nameIEEE International Symposium on Circuits and Systemsuulm.conferenceName
Conference placeSeoul, South Koreauulm.conferencePlace
Conference start date2012-05-20uulm.conferenceStartDate
Conference end date2012-05-23uulm.conferenceEndDate
Open AccessNouulm.OA
CommunityFakultät für Ingenieurwissenschaften, Informatik und Psychologieuulm.community
WoS000316903700018uulm.identifier.wos
Bibliographyuulmuulm.bibliographie


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