Author | Pelzmann, A | dc.contributor.author |
Author | Mayer, M | dc.contributor.author |
Author | Kirchner, C | dc.contributor.author |
Author | Sowada, D | dc.contributor.author |
Author | Rotter, T | dc.contributor.author |
Author | Kamp, M | dc.contributor.author |
Author | Ebeling, Karl Joachim | dc.contributor.author |
Author | Christiansen, S | dc.contributor.author |
Author | Albrecht, M | dc.contributor.author |
Author | Strunk, HP | dc.contributor.author |
Author | Hollander, B | dc.contributor.author |
Author | Mantl, S | dc.contributor.author |
Date of accession | 2018-03-28T13:04:47Z | dc.date.accessioned |
Available in OPARU since | 2018-03-28T13:04:47Z | dc.date.available |
Date of first publication | 1996 | dc.date.issued |
Language | en | dc.language.iso |
Publisher | Universität Ulm | dc.publisher |
Dewey Decimal Group | DDC 620 / Engineering & allied operations | dc.subject.ddc |
Title | Determination of the dislocation densities in GaN on c-oriented sapphire | dc.title |
Resource type | Wissenschaftlicher Artikel | dc.type |
Faculty | Fakultät für Ingenieurwissenschaften, Informatik und Psychologie | uulm.affiliationGeneral |
Institution | Institut für Optoelektronik | uulm.affiliationSpecific |
DCMI Type | Text | uulm.typeDCMI |
Category | Publikationsnachweise | uulm.category |
Source - Title of source | MRS Internet Journal of Nitride Semiconductor Research | source.title |
Source - Place of publication | Materials Research Society | source.publisher |
Source - Volume | 1 | source.volume |
Source - Issue | 1-46 | source.issue |
Source - Year | 1996 | source.year |
Source - From page | U313 | source.fromPage |
Source - To page | U320 | source.toPage |
Source - Article number | 40 | source.articleNumber |
Source - ISSN | 1092-5783 | source.identifier.issn |
Open Access | No | uulm.OA |
Community | Fakultät für Ingenieurwissenschaften, Informatik und Psychologie | uulm.community |
WoS | A1996WY82100040 | uulm.identifier.wos |
Bibliography | uulm | uulm.bibliographie |