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AuthorSalviati, Gdc.contributor.author
AuthorZanotti-Fregonara, Cdc.contributor.author
AuthorAlbrecht, Mdc.contributor.author
AuthorChristiansen, Sdc.contributor.author
AuthorStrunk, HPdc.contributor.author
AuthorMayer, Mdc.contributor.author
AuthorPelzmann, Adc.contributor.author
AuthorKamp, Mdc.contributor.author
AuthorEbeling, Karl Joachimdc.contributor.author
AuthorBremser, MDdc.contributor.author
AuthorDavis, RFdc.contributor.author
AuthorShreter, YGdc.contributor.author
Date of accession2018-03-21T10:37:36Zdc.date.accessioned
Available in OPARU since2018-03-21T10:37:36Zdc.date.available
Date of first publication1997dc.date.issued
Languageendc.language.iso
PublisherUniversität Ulmdc.publisher
Keywordchemical-vapor-depositiondc.subject
Keywordthin-filmsdc.subject
Keywordphase epitaxydc.subject
Keywordbuffer layersdc.subject
Dewey Decimal GroupDDC 620 / Engineering & allied operationsdc.subject.ddc
TitleCrystal defects and optical properties of GaN grown with different techniques: stacking fault related luminescencedc.title
Resource typeBeitrag zu einer Konferenzdc.type
FacultyFakultät für Ingenieurwissenschaften, Informatik und Psychologieuulm.affiliationGeneral
InstitutionInstitut für Optoelektronikuulm.affiliationSpecific
DCMI TypeTextuulm.typeDCMI
CategoryPublikationsnachweiseuulm.category
Source - Title of sourceMicroscopy of emiconducting Materials 1997source.title
Quellenangabe - HerausgeberCullis, AGsource.contributor.editor1
Quellenangabe - HerausgeberHutchison, JLsource.contributor.editor1
Source - PublisherBristolsource.publisherPlace
Source - Place of publicationIOP Publishingsource.publisher
Source - Issue157source.issue
Source - Year1997source.year
Source - From page199source.fromPage
Source - To page204source.toPage
Source - SerialInstitute of physics conference seriessource.series
Source - ISSN0951-3248source.identifier.issn
Source - ISBN0-7503-0464-2source.identifier.isbn
Conference nameRoyal Microscopical Society Conference on Microscopy of Semiconducting Materialsuulm.conferenceName
Conference placeOxforduulm.conferencePlace
Conference start date1997-04-07uulm.conferenceStartDate
Conference end date1997-04-10uulm.conferenceEndDate
Open AccessNouulm.OA
CommunityFakultät für Ingenieurwissenschaften, Informatik und Psychologieuulm.community
WoS000071954600037uulm.identifier.wos
Bibliographyuulmuulm.bibliographie


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