| Author | Hinz, Michael | dc.contributor.author |
| Author | Marti, Othmar | dc.contributor.author |
| Author | Gotsmann, Bernd | dc.contributor.author |
| Author | Lantz, Mark A. | dc.contributor.author |
| Author | Dürig, Urs | dc.contributor.author |
| Date of accession | 2023-01-24T13:46:30Z | dc.date.accessioned |
| Available in OPARU since | 2023-01-24T13:46:30Z | dc.date.available |
| Date of first publication | 2008 | dc.date.issued |
| Language | en | dc.language.iso |
| Publisher | Universität Ulm | dc.publisher |
| Keyword | CONDUCTIVITY | dc.subject |
| Dewey Decimal Group | DDC 530 / Physics | dc.subject.ddc |
| Title | High resolution vacuum scanning thermal microscopy of HfO2 and SiO2 | dc.title |
| Resource type | Wissenschaftlicher Artikel | dc.type |
| Faculty | Fakultät für Naturwissenschaften | uulm.affiliationGeneral |
| Institution | Institut für Experimentelle Physik | uulm.affiliationSpecific |
| DCMI Type | Text | uulm.typeDCMI |
| Category | Publikationsnachweise | uulm.category |
| DOI (external) | 10.1063/1.2840186 | dc.identifier.doiExternal |
| Source - Title of source | Applied Physics Letters | source.title |
| Source - Place of publication | American Institute of Physics | source.publisher |
| Source - Volume | 92 | source.volume |
| Source - Issue | 4 | source.issue |
| Source - Year | 2008 | source.year |
| Source - Article number | 043122 | source.articleNumber |
| Source - ISSN | 0003-6951 | source.identifier.issn |
| Source - eISSN | 1077-3118 | source.identifier.eissn |
| Community | Universität Ulm | uulm.community |
| WoS | 000252860400097 | uulm.identifier.wos |
| Bibliography | uulm | uulm.bibliographie |
