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AuthorKuzmik, Jandc.contributor.author
AuthorBychikhin, Sergeydc.contributor.author
AuthorPichonat, Emmanuelledc.contributor.author
AuthorGaquiere, Christophedc.contributor.author
AuthorMorvan, Erwandc.contributor.author
AuthorKohn, Erharddc.contributor.author
AuthorTeyssier, Jean-Pierredc.contributor.author
AuthorPogany, Dionyzdc.contributor.author
Date of accession2022-01-25T07:06:57Zdc.date.accessioned
Available in OPARU since2022-01-25T07:06:57Zdc.date.available
Date of first publication2009dc.date.issued
Languageendc.language.iso
PublisherUniversität Ulmdc.publisher
KeywordSelf-heatingdc.subject
KeywordTemperature measurementsdc.subject
KeywordHigh-electron-mobility transistorsdc.subject
KeywordAlGaN/GaNdc.subject
Dewey Decimal GroupDDC 620 / Engineering & allied operationsdc.subject.ddc
TitleSelf-heating phenomena in high-power III-N transistors and new thermal characterization methods developed within EU project TARGETdc.title
Resource typeWissenschaftlicher Artikeldc.type
FacultyFakultät für Ingenieurwissenschaften, Informatik und Psychologieuulm.affiliationGeneral
InstitutionInstitut für Elektronische Bauelemente und Schaltungenuulm.affiliationSpecific
DCMI TypeTextuulm.typeDCMI
CategoryPublikationsnachweiseuulm.category
DOI (external)10.1017/S1759078709990444dc.identifier.doiExternal
Source - Title of sourceInternational Journal of Microwave and Wireless Technologiessource.title
Source - Place of publicationCambridge Univ. Presssource.publisher
Source - Volume1source.volume
Source - Issue2, SIsource.issue
Source - Year2009source.year
Source - From page153source.fromPage
Source - To page160source.toPage
Source - ISSN1759-0787source.identifier.issn
Source - eISSN1759-0795source.identifier.eissn
CommunityFakultät für Ingenieurwissenschaften, Informatik und Psychologieuulm.community
WoS000208609500009uulm.identifier.wos
Bibliographyuulmuulm.bibliographie


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