Self-heating phenomena in high-power III-N transistors and new thermal characterization methods developed within EU project TARGET

Erstveröffentlichung
2009Authors
Kuzmik, Jan
Bychikhin, Sergey
Pichonat, Emmanuelle
Gaquiere, Christophe
Morvan, Erwan
Wissenschaftlicher Artikel
Published in
International Journal of Microwave and Wireless Technologies ; 1 (2009), 2, SI. - S. 153-160. - ISSN 1759-0787. - eISSN 1759-0795
Link to publication
https://dx.doi.org/10.1017/S1759078709990444Faculties
Fakultät für Ingenieurwissenschaften, Informatik und PsychologieInstitutions
Institut für Elektronische Bauelemente und SchaltungenSubject headings
[Free subject headings]: Self-heating | Temperature measurements | High-electron-mobility transistors | AlGaN/GaN[DDC subject group]: DDC 620 / Engineering & allied operations