Interfacial microstructure and defect analysis in Cu(In,Ga)Se([sub]2)-based multilayered film by analytical transmission electron microscopy and focused ion beam

Erstveröffentlichung

2009

Authors

Zhang, Zaoli

Wagner, Thomas

Wissenschaftlicher Artikel

Published in

Thin Solid Films ; 517 (2009), 15. - S. 4329-4335. - ISSN 0040-6090

Link to publication

https://dx.doi.org/10.1016/j.tsf.2009.02.130

Institutions

ZE Elektronenmikroskopie

Subject headings

[Free subject headings]: Transmission electron microscopy | Interface | Multilayers | Solar cells | Focused ion beam | CU(IN,GA)SE-2 THIN-FILMS | HETEROJUNCTION SOLAR-CELLS | 3D
[DDC subject group]: DDC 530 / Physics | DDC 620 / Engineering & allied operations

Metadata

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