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AuthorKlein, Olaf P.dc.contributor.author
AuthorBiskupek, Johannesdc.contributor.author
AuthorForghani, Kamrandc.contributor.author
AuthorScholz, Ferdinanddc.contributor.author
AuthorKaiser, Utedc.contributor.author
Date of accession2021-05-12T08:12:33Zdc.date.accessioned
Available in OPARU since2021-05-12T08:12:33Zdc.date.available
Date of first publication2011dc.date.issued
Languageendc.language.iso
PublisherUniversität Ulmdc.publisher
KeywordDislocationsdc.subject
KeywordEDXdc.subject
KeywordTransmission electron microscopydc.subject
KeywordMetalorganic vapour phase epitaxydc.subject
KeywordAlGaNdc.subject
KeywordSiNdc.subject
KeywordVAPOR-PHASE EPITAXYdc.subject
KeywordLIGHT-EMITTING DIODESdc.subject
KeywordLATERAL OVERGROWTHdc.subject
KeywordALN LAYERSdc.subject
KeywordTHREADING DISLOCATIONSdc.subject
KeywordGANdc.subject
KeywordREDUCTIONdc.subject
KeywordFILMSdc.subject
KeywordMOVPEdc.subject
KeywordALXGA1-XNdc.subject
Dewey Decimal GroupDDC 500 / Natural sciences & mathematicsdc.subject.ddc
Dewey Decimal GroupDDC 530 / Physicsdc.subject.ddc
Dewey Decimal GroupDDC 620 / Engineering & allied operationsdc.subject.ddc
TitleTEM investigations on growth interrupted samples for the correlation of the dislocation propagation and growth mode variations in AlGaN deposited on SiNx interlayersdc.title
Resource typeWissenschaftlicher Artikeldc.type
FacultyFakultät für Ingenieurwissenschaften, Informatik und Psychologieuulm.affiliationGeneral
InstitutionZE Elektronenmikroskopieuulm.affiliationSpecific
InstitutionInstitut für Optoelektronikuulm.affiliationSpecific
DCMI TypeTextuulm.typeDCMI
CategoryPublikationsnachweiseuulm.category
DOI (external)10.1016/j.jcrysgro.2011.03.050dc.identifier.doiExternal
Source - Title of sourceJournal of Crystal Growthsource.title
Source - Place of publicationElsevier Sciencesource.publisher
Source - Volume324source.volume
Source - Issue1source.issue
Source - Year2011source.year
Source - From page63source.fromPage
Source - To page72source.toPage
Source - ISSN0022-0248source.identifier.issn
Source - eISSN1873-5002source.identifier.eissn
CommunityZentrale Einrichtungenuulm.community
CommunityFakultät für Ingenieurwissenschaften, Informatik und Psychologieuulm.community
WoS000292362600010uulm.identifier.wos
Bibliographyuulmuulm.bibliographie


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