Roughness evolution in strongly interacting donor:acceptor mixtures of molecular semiconductors. An in situ, real-time growth study using x-ray reflectivity

Erstveröffentlichung

2021

Authors

Duva, G.

Pithan, L.

Gerlach, A.

Janik, A.

Hinderhofer, A.

et al.

Wissenschaftlicher Artikel

Published in

Journal of Physics: Condensed Matter ; 33 (2021), 11. - Art.-Nr. 115003. - ISSN 0953-8984. - eISSN 1361-648X

Link to publication

https://dx.doi.org/10.1088/1361-648X/abd11c

Faculties

Fakultät für Naturwissenschaften

Institutions

Institut für Experimentelle Physik

Subject headings

[Free subject headings]: organic semiconductors | donor | acceptor | x-ray scattering | in situ | real-time | growth | OPTICAL-PROPERTIES | BEAM DEPOSITION | THIN-FILMS | TRANSPORT | SURFACE | PERFLUOROPENTACENE | TRANSISTORS | SEXIPHENYL | MODE
[DDC subject group]: DDC 530 / Physics

Metadata

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