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AuthorEifert, Alexanderdc.contributor.author
AuthorSmirnov, Waldemardc.contributor.author
AuthorFrittmann, Stefandc.contributor.author
AuthorNebel, Christophdc.contributor.author
AuthorMizaikoff, Borisdc.contributor.author
AuthorKranz, Christinedc.contributor.author
Date of accession2021-03-02T12:33:02Zdc.date.accessioned
Available in OPARU since2021-03-02T12:33:02Zdc.date.available
Date of first publication2012dc.date.issued
Languageendc.language.iso
PublisherUniversität Ulmdc.publisher
KeywordBoron-doped diamond electrodedc.subject
KeywordCombined atomic force-scanning electrochemical microscopydc.subject
KeywordAFM tip-integrated electrodedc.subject
KeywordSCANNING ELECTROCHEMICAL MICROSCOPYdc.subject
KeywordDEPOSITIONdc.subject
KeywordBEHAVIORdc.subject
Dewey Decimal GroupDDC 540 / Chemistry & allied sciencesdc.subject.ddc
TitleAtomic force microscopy probes with integrated boron doped diamond electrodes: Fabrication and applicationdc.title
Resource typeWissenschaftlicher Artikeldc.type
FacultyFakultät für Naturwissenschaftenuulm.affiliationGeneral
InstitutionInstitut für Analytische und Bioanalytische Chemieuulm.affiliationSpecific
DCMI TypeTextuulm.typeDCMI
CategoryPublikationsnachweiseuulm.category
DOI (external)10.1016/j.elecom.2012.09.011dc.identifier.doiExternal
Source - Title of sourceElectrochemistry Communicationssource.title
Source - Place of publicationElseviersource.publisher
Source - Volume25source.volume
Source - Year2012source.year
Source - From page30source.fromPage
Source - To page34source.toPage
Source - ISSN1388-2481source.identifier.issn
CommunityFakultät für Naturwissenschaftenuulm.community
WoS000311927300009uulm.identifier.wos
Bibliographyuulmuulm.bibliographie


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