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AuthorKretschmer, Silvandc.contributor.author
AuthorLehnert, Tibordc.contributor.author
AuthorKaiser, Utedc.contributor.author
AuthorKrasheninnikov, Arkady V. dc.contributor.author
Date of accession2020-05-20T11:22:41Zdc.date.accessioned
Available in OPARU since2020-05-20T11:22:41Zdc.date.available
Date of first publication2020dc.date.issued
Languageendc.language.iso
PublisherUniversität Ulmdc.publisher
KeywordTwo-dimensional materialsdc.subject
Keywordtransition-metal dichalcogenidesdc.subject
Keywordhigh-resolution transmission electron microscopydc.subject
Keyworddefectsdc.subject
KeywordRADIATION-DAMAGEdc.subject
KeywordVOLTAGEdc.subject
Dewey Decimal GroupDDC 530 / Physicsdc.subject.ddc
Dewey Decimal GroupDDC 540 / Chemistry & allied sciencesdc.subject.ddc
Dewey Decimal GroupDDC 620 / Engineering & allied operationsdc.subject.ddc
TitleFormation of Defects in Two-Dimensional MoS2 in the Transmission Electron Microscope at Electron Energies below the Knock-on Threshold: The Role of Electronic Excitationsdc.title
Resource typeWissenschaftlicher Artikeldc.type
InstitutionZE Elektronenmikroskopieuulm.affiliationSpecific
DCMI TypeTextuulm.typeDCMI
CategoryPublikationsnachweiseuulm.category
DOI (external)10.1021/acs.nanolett.0c00670dc.identifier.doiExternal
Source - Title of sourceNano Letterssource.title
Source - Place of publicationAmerican Chemical Societysource.publisher
Source - Volume20source.volume
Source - Issue4source.issue
Source - Year2020source.year
Source - From page2865source.fromPage
Source - To page2870source.toPage
Source - ISSN1530-6984source.identifier.issn
Source - eISSN1530-6992source.identifier.eissn
Suitable communityZentrale Einrichtungenuulm.community
WoS000526413400085uulm.identifier.wos
University Bibliographyjauulm.unibibliographie


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