Nanoscale characterisation of semiconductors by cathodoluminescence

Erstveröffentlichung
2014
Authors
Thonke, K.
Tischer, I.
Hocker, M.
Schirra, M.
Fujan, K.
et al.
Beitrag zu einer Konferenz


Published in
EMAS 2013 Workshop: 13th European Workshop on Modern Developments and Applications in Microbeam Analysis / Llovet, Xavier (Hrsg.). - Bristol : IOP Publishing, 2014. - (IOP Conference Series-Materials Science and Engineering ; 55). - Art.-Nr. UNSP 012018. - ISSN 1757-8981
Link to publication
https://dx.doi.org/10.1088/1757-899X/55/1/012018
Faculties
Fakultät für Naturwissenschaften
Institutions
Institut für Quantenmaterie
Conference
13th European Workshop of the European-Microbeam-Analysis-Society on Modern Developments and Applications in Microbeam Analysis (EMAS), 2013-05-12 - 2013-05-16, Porto
Funding information
SFB 569 / Hierarchische Strukturbildung und Funktion Organisch-Anorganischer Nanosysteme / DFG / SFB / 5484409
Fachliche Einordnung
[Freie Tags]: ELECTRON-MICROSCOPY, NITRIDE, LUMINESCENCE, PENETRATION, COLLECTION, RESOLUTION, LIGHT
DDC 530 / Physics, DDC 620 / Engineering & allied operations
Metadata
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