Practical aspects of the use of the X-2 holder for HRTEM-quality TEM sample preparation by FIB
Wissenschaftlicher Artikel
Authors
van Mierlo, Willem
Geiger, Dorin
Robins, Alan
Stumpf, Matthias
Ray, Mary Louise
Institutions
ZE ElektronenmikroskopiePublished in
Ultramicroscopy ; 147 (2014). - S. 149-155. - ISSN 0304-3991. - eISSN 1879-2723