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AuthorBhushan, Bharatdc.contributor.author
AuthorMarti, Othmardc.contributor.author
Date of accession2020-04-17T09:03:58Zdc.date.accessioned
Available in OPARU since2020-04-17T09:03:58Zdc.date.available
Date of first publication2011dc.date.issued
Languageendc.language.iso
PublisherUniversität Ulmdc.publisher
KeywordATOMIC-FORCE-MICROSCOPEdc.subject
KeywordION-CONDUCTANCE MICROSCOPEdc.subject
KeywordLANGMUIR-BLODGETT-FILMSdc.subject
KeywordTUNNELING-MICROSCOPYdc.subject
KeywordNANOMETER-SCALEdc.subject
KeywordOPTICAL MICROSCOPYdc.subject
KeywordSILICON SURFACESdc.subject
KeywordKELVIN PROBEdc.subject
KeywordCAPACITANCE MICROSCOPYdc.subject
KeywordGENERAL-PRINCIPLESdc.subject
Dewey Decimal GroupDDC 620 / Engineering & allied operationsdc.subject.ddc
TitleScanning Probe Microscopy - Principle of Operation, Instrumentation, and Probesdc.title
Resource typeTeil eines Buchesdc.type
FacultyFakultät für Naturwissenschaftenuulm.affiliationGeneral
InstitutionInstitut für Experimentelle Physikuulm.affiliationSpecific
DCMI TypeTextuulm.typeDCMI
CategoryPublikationsnachweiseuulm.category
DOI (external)10.1007/978-3-642-15283-2_2dc.identifier.doiExternal
Source - Title of sourceNanotribology and nanomechanics. 3. ed. Vol. 1: Measurement techniques and nanomechanicssource.title
Quellenangabe - HerausgeberBhushan, Bharatsource.contributor.editor1
Source - PublisherBerlinsource.publisherPlace
Source - Place of publicationSpringersource.publisher
Source - Year2011source.year
Source - From page37source.fromPage
Source - To page110source.toPage
Source - ISBN978-3-642-15282-5source.identifier.isbn
CommunityFakultät für Naturwissenschaftenuulm.community
WoS000292010400002uulm.identifier.wos
Bibliographyuulmuulm.bibliographie


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