Show simple item record

AuthorOstermaier, Clemensdc.contributor.author
AuthorLagger, Peterdc.contributor.author
AuthorAlomari, Mohammeddc.contributor.author
AuthorHerfurth, Patrickdc.contributor.author
AuthorMaier, Daviddc.contributor.author
AuthorAlexewicz, Alexanderdc.contributor.author
Authordi Forte-Poisson, Marie-Antoinettedc.contributor.author
AuthorDelage, Sylvain L.dc.contributor.author
AuthorStrasser, Gottfrieddc.contributor.author
AuthorPogany, Dionyzdc.contributor.author
AuthorKohn, Erharddc.contributor.author
Date of accession2020-04-01T11:16:36Zdc.date.accessioned
Available in OPARU since2020-04-01T11:16:36Zdc.date.available
Date of first publication2012dc.date.issued
Languageendc.language.iso
PublisherUniversität Ulmdc.publisher
KeywordINDUCED LEAKAGE CURRENTdc.subject
Dewey Decimal GroupDDC 530 / Physicsdc.subject.ddc
Dewey Decimal GroupDDC 620 / Engineering & allied operationsdc.subject.ddc
TitleReliability investigation of the degradation of the surface passivation of InAlN/GaN HEMTs using a dual gate structuredc.title
Resource typeBeitrag zu einer Konferenzdc.type
FacultyFakultät für Ingenieurwissenschaften, Informatik und Psychologieuulm.affiliationGeneral
InstitutionInstitut für Elektronische Bauelemente und Schaltungenuulm.affiliationSpecific
DCMI TypeTextuulm.typeDCMI
CategoryPublikationsnachweiseuulm.category
DOI (external)10.1016/j.microrel.2012.06.006dc.identifier.doiExternal
Source - Title of sourceMicroelectronics Reliabilitysource.title
Source - PublisherOxfordsource.publisherPlace
Source - Place of publicationElseviersource.publisher
Source - Volume52source.volume
Source - Issue9-10, SIsource.issue
Source - Year2012source.year
Source - From page1812source.fromPage
Source - To page1815source.toPage
Source - ISSN0026-2714source.identifier.issn
Conference name23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF)uulm.conferenceName
Conference placeCagliari, Italyuulm.conferencePlace
Conference start date2012-10-01uulm.conferenceStartDate
Conference end date2012-10-05uulm.conferenceEndDate
Suitable communityFakultät für Ingenieurwissenschaften, Informatik und Psychologieuulm.community
WoS000309785400012uulm.identifier.wos
University Bibliographyjauulm.unibibliographie


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record