XPS and ToF-SIMS investigation of nanocrystalline diamond oxidized surfaces

Erstveröffentlichung

2013

Authors

Torrengo, S.

Canteri, R.

Dell'Anna, R.

Minati, L.

Pasquarelli, A.

et al.

Wissenschaftlicher Artikel

Published in

Applied Surface Science ; 276 (2013). - S. 101-111. - ISSN 0169-4332. - eISSN 1873-5584

Link to publication

https://dx.doi.org/10.1016/j.apsusc.2013.03.041

Faculties

Fakultät für Ingenieurwissenschaften, Informatik und Psychologie

Institutions

Institut für Elektronische Bauelemente und Schaltungen

Subject headings

[Free subject headings]: Hydrogenated diamond | Diamond oxidation | XPS | UPS | ToF SIMS | TEMPERATURE-PROGRAMMED DESORPTION | DOPED DIAMOND | MOLECULAR-OXYGEN | PHOTOELECTRON-SPECTROSCOPY | OXIDATION | FILMS | FUNCTIONALIZATION | CONDUCTIVITY | ADSORPTION | REACTIVITY
[DDC subject group]: DDC 540 / Chemistry & allied sciences

Metadata

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