XPS and ToF-SIMS investigation of nanocrystalline diamond oxidized surfaces

Erstveröffentlichung
2013Authors
Torrengo, S.
Canteri, R.
Dell'Anna, R.
Minati, L.
Pasquarelli, A.
Wissenschaftlicher Artikel
Published in
Applied Surface Science ; 276 (2013). - S. 101-111. - ISSN 0169-4332. - eISSN 1873-5584
Link to publication
https://dx.doi.org/10.1016/j.apsusc.2013.03.041Faculties
Fakultät für Ingenieurwissenschaften, Informatik und PsychologieInstitutions
Institut für Elektronische Bauelemente und SchaltungenSubject headings
[Free subject headings]: Hydrogenated diamond | Diamond oxidation | XPS | UPS | ToF SIMS | TEMPERATURE-PROGRAMMED DESORPTION | DOPED DIAMOND | MOLECULAR-OXYGEN | PHOTOELECTRON-SPECTROSCOPY | OXIDATION | FILMS | FUNCTIONALIZATION | CONDUCTIVITY | ADSORPTION | REACTIVITY[DDC subject group]: DDC 540 / Chemistry & allied sciences