Online Reliability Testing for PUF Key Derivation
Beitrag zu einer Konferenz
Faculties
Fakultät für Ingenieurwissenschaften, Informatik und PsychologieInstitutions
Institut für NachrichtentechnikPublished in
Proceedings of the Sixth International Workshop on Trustworthy Embedded Devices (TrustED 2016). - New York, NY : Association for Computing Machinery, 2016. - S. 15-22. - ISBN 978-1-4503-4567-5
Link to publication
https://dx.doi.org/10.1145/2995289.2995293Conference
6th International Workshop on Trustworthy Embedded Devices (TrustED), 2016-10-28, Vienna
Dewey Decimal Group
DDC 000 / Computer science, information & general worksDDC 620 / Engineering & allied operations