Online Reliability Testing for PUF Key Derivation

Erstveröffentlichung
2016
Authors
Hiller, Matthias
Oenalan, Aysun Gurur
Sigl, Georg
Bossert, Martin
Beitrag zu einer Konferenz


Published in
Proceedings of the Sixth International Workshop on Trustworthy Embedded Devices (TrustED 2016). - New York, NY : Association for Computing Machinery, 2016. - S. 15-22. - ISBN 978-1-4503-4567-5
Link to publication
https://dx.doi.org/10.1145/2995289.2995293
Faculties
Fakultät für Ingenieurwissenschaften, Informatik und Psychologie
Institutions
Institut für Nachrichtentechnik
Conference
6th International Workshop on Trustworthy Embedded Devices (TrustED), 2016-10-28, Vienna
Subject headings
[DDC subject group]: DDC 000 / Computer science, information & general works | DDC 620 / Engineering & allied operations
Metadata
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