INTERVESSEL PIT MEMBRANE THICKNESS AS A KEY DETERMINANT OF EMBOLISM RESISTANCE IN ANGIOSPERM XYLEM

Erstveröffentlichung
2016Authors
Li, Shan
Lens, Frederic
Espino, Susana
Karimi, Zohreh
Klepsch, Matthias
Wissenschaftlicher Artikel
Published in
IAWA Journal ; 37 (2016), 2. - S. 152-171. - ISSN 0928-1541. - eISSN 2294-1932