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AuthorBoerrnert, Felixdc.contributor.author
AuthorKaiser, Utedc.contributor.author
Date of accession2019-05-07T13:05:52Zdc.date.accessioned
Available in OPARU since2019-05-07T13:05:52Zdc.date.available
Date of first publication2018dc.date.issued
Languageendc.language.iso
PublisherUniversität Ulmdc.publisher
Keywordtransmission electron-microscopydc.subject
Keywordresolutiondc.subject
Dewey Decimal GroupDDC 530 / Physicsdc.subject.ddc
TitleChromatic- and geometric-aberration-corrected TEM imaging at 80 kV and 20 kVdc.title
Resource typeWissenschaftlicher Artikeldc.type
InstitutionZE Elektronenmikroskopieuulm.affiliationSpecific
DCMI TypeTextuulm.typeDCMI
CategoryPublikationsnachweiseuulm.category
DOI (external)10.1103/PhysRevA.98.023861dc.identifier.doiExternal
Source - Title of sourcePhysical Review Asource.title
Source - Place of publicationAmerican Physical Societysource.publisher
Source - Volume98source.volume
Source - Issue2source.issue
Source - Year2018source.year
Source - Article number023861source.articleNumber
Source - ISSN2469-9926source.identifier.issn
Source - eISSN2469-9934source.identifier.eissn
CommunityZentrale Einrichtungenuulm.community
WoS000443137500006uulm.identifier.wos
Bibliographyuulmuulm.bibliographie


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