Chromatic- and geometric-aberration-corrected TEM imaging at 80 kV and 20 kV

Erstveröffentlichung
2018Authors
Boerrnert, Felix
Kaiser, Ute
Wissenschaftlicher Artikel
Published in
Physical Review A ; 98 (2018), 2. - Art.-Nr. 023861. - ISSN 2469-9926. - eISSN 2469-9934
Link to publication
https://dx.doi.org/10.1103/PhysRevA.98.023861Institutions
ZE ElektronenmikroskopieSubject headings
[Free subject headings]: transmission electron-microscopy | resolution[DDC subject group]: DDC 530 / Physics