| Author | Ebeling, Karl Joachim | dc.contributor.author |
| Author | Michalzik, Rainer | dc.contributor.author |
| Date of accession | 2019-03-20T06:10:01Z | dc.date.accessioned |
| Available in OPARU since | 2019-03-20T06:10:01Z | dc.date.available |
| Date of first publication | 2017 | dc.date.issued |
| Language | en | dc.language.iso |
| Publisher | Universität Ulm | dc.publisher |
| Dewey Decimal Group | DDC 620 / Engineering & allied operations | dc.subject.ddc |
| Title | VCSEL Technology for Imaging and Sensor Systems Applications | dc.title |
| Resource type | Beitrag zu einer Konferenz | dc.type |
| Faculty | Fakultät für Ingenieurwissenschaften, Informatik und Psychologie | uulm.affiliationGeneral |
| Institution | Institut für Optoelektronik | uulm.affiliationSpecific |
| DCMI Type | Text | uulm.typeDCMI |
| Category | Publikationsnachweise | uulm.category |
| Source - Title of source | 2017 22nd Microoptics Conference (MOC) | source.title |
| Source - Publisher | New York | source.publisherPlace |
| Source - Place of publication | Institute of Electrical and Electronics Engineers | source.publisher |
| Source - Year | 2017 | source.year |
| Source - From page | 20 | source.fromPage |
| Source - To page | 21 | source.toPage |
| Source - ISBN | 978-4-8634-8609-6 | source.identifier.isbn |
| Conference name | 22nd Microoptics Conference (MOC) | uulm.conferenceName |
| Conference place | Univ Tokyo, Inst Ind Sci, Japan | uulm.conferencePlace |
| Conference start date | 2017-11-19 | uulm.conferenceStartDate |
| Conference end date | 2017-11-22 | uulm.conferenceEndDate |
| Community | Fakultät für Ingenieurwissenschaften, Informatik und Psychologie | uulm.community |
| WoS | 000427705300008 | uulm.identifier.wos |
| Bibliography | uulm | uulm.bibliographie |
