Author | Ebeling, Karl Joachim | dc.contributor.author |
Author | Michalzik, Rainer | dc.contributor.author |
Date of accession | 2019-03-20T06:10:01Z | dc.date.accessioned |
Available in OPARU since | 2019-03-20T06:10:01Z | dc.date.available |
Date of first publication | 2017 | dc.date.issued |
Language | en | dc.language.iso |
Publisher | Universität Ulm | dc.publisher |
Dewey Decimal Group | DDC 620 / Engineering & allied operations | dc.subject.ddc |
Title | VCSEL Technology for Imaging and Sensor Systems Applications | dc.title |
Resource type | Beitrag zu einer Konferenz | dc.type |
Faculty | Fakultät für Ingenieurwissenschaften, Informatik und Psychologie | uulm.affiliationGeneral |
Institution | Institut für Optoelektronik | uulm.affiliationSpecific |
DCMI Type | Text | uulm.typeDCMI |
Category | Publikationsnachweise | uulm.category |
Source - Title of source | 2017 22nd Microoptics Conference (MOC) | source.title |
Source - Publisher | New York | source.publisherPlace |
Source - Place of publication | Institute of Electrical and Electronics Engineers | source.publisher |
Source - Year | 2017 | source.year |
Source - From page | 20 | source.fromPage |
Source - To page | 21 | source.toPage |
Source - ISBN | 978-4-8634-8609-6 | source.identifier.isbn |
Conference name | 22nd Microoptics Conference (MOC) | uulm.conferenceName |
Conference place | Univ Tokyo, Inst Ind Sci, Japan | uulm.conferencePlace |
Conference start date | 2017-11-19 | uulm.conferenceStartDate |
Conference end date | 2017-11-22 | uulm.conferenceEndDate |
Suitable community | Fakultät für Ingenieurwissenschaften, Informatik und Psychologie | uulm.community |
WoS | 000427705300008 | uulm.identifier.wos |
University Bibliography | ja | uulm.unibibliographie |