VCSEL Technology for Imaging and Sensor Systems Applications
Beitrag zu einer Konferenz
Authors
Ebeling, Karl Joachim
Michalzik, Rainer
Faculties
Fakultät für Ingenieurwissenschaften, Informatik und PsychologieInstitutions
Institut für OptoelektronikPublished in
2017 22nd Microoptics Conference (MOC). - New York : Institute of Electrical and Electronics Engineers, 2017. - S. 20-21. - ISBN 978-4-8634-8609-6
Conference
22nd Microoptics Conference (MOC), 2017-11-19 - 2017-11-22, Univ Tokyo, Inst Ind Sci, Japan