VCSEL Technology for Imaging and Sensor Systems Applications

Erstveröffentlichung
2017
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Beitrag zu einer Konferenz

Authors
Ebeling, Karl Joachim
Michalzik, Rainer
Faculties
Fakultät für Ingenieurwissenschaften, Informatik und Psychologie
Institutions
Institut für Optoelektronik
Published in
2017 22nd Microoptics Conference (MOC). - New York : Institute of Electrical and Electronics Engineers, 2017. - S. 20-21. - ISBN 978-4-8634-8609-6
Conference
22nd Microoptics Conference (MOC), 2017-11-19 - 2017-11-22, Univ Tokyo, Inst Ind Sci, Japan
Dewey Decimal Group
DDC 620 / Engineering & allied operations
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